Residual stress, Retained Austenite measurements

Xstress X-ray diffractometers: for residual stress and retained austenite measurements.

Xstress product line of X-ray diffractometers is suitable for use in the field, factory, and laboratory settings. From system setup to post measurement analysis, easy to understand data is delivered quickly so that no time is wasted in improving your quality inspection process.
X-ray diffraction is the standard method for measuring surface stresses non-destructively. Additionally, a stress depth profile can be obtained via electropolishing. Xstress diffractometers are useful tools during the product or production development phase and in quality control.


  • Xstress D45
  • Xstress G2
  • Xstress G2R
  • Xstress G3
  • Xstress Robot

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